TY  - CONF
T1  - Strain imaging in thermoelectric components by laser probe shearography
T2  - Proceedings International conference on Thermoelectrics
Y1  - 2001
A1  - Jorez, S.
A1  - Dilhaire, S.
A1  - L. Patino Lopez
A1  - Grauby, S.
A1  - Claeys, W.
A1  - K-I. Uemura
A1  - Stockholm, J. G.
JF  - Proceedings International conference on Thermoelectrics
PB  - IEEE Catalog number 01TH8589,
CY  - Beijing China
SN  - 1094-2734
ER  - 

TY  - CONF
T1  - Study of the thermal behaviour of PN thermoelectric couples by Laser Probe Interferometric Measurement
T2  - Proceedings International conference on Thermoelectrics
Y1  - 2001
A1  - L. D. Patiño_Lopez
A1  - Dilhaire, S.
A1  - Grauby, S.
A1  - Jorez, S.
A1  - Claeys, W.
A1  - K-I. Uemura
A1  - John G. Stockholm
JF  - Proceedings International conference on Thermoelectrics
PB  - IEEE Catalog number 01TH8589
CY  - Beijing, China
SN  - 1094-2734
ER  - 

TY  - Generic
T1  - Study of the thermal behaviour of PN thermoelectric couples by laser probe interferometric measurement
T2  - Proceedings ICT2001. 20 International Conference on Thermoelectrics
Y1  - 2001
A1  - Patino-Lopez, L. D.
A1  - Dilhaire, S.
A1  - Grauby, S.
A1  - Jorez, S.
A1  - Claeys, W.
A1  - Uemura, K.
A1  - Stockholm, J. G.
KW  - light interferometry
AB  - The purpose of the present paper is to provide experimental data related to the temperature distribution within thermoelectric devices (TE). Moreover our aim is to get this knowledge for a dynamic temperature response of the device. We propose a non-contact optical measuring method, based upon very high-resolution interferometry, to map temperature effects upon the surface of running thermoelectric devices. The Peltier sources within the device generate thermal waves associated to heat transport. These waves interfere when AC current is driven through the device. The interferences are clearly observed in our measurements, showing how heat flows from different sources and merge. The measuring method can be used to check material properties which in turns allows to optimize contact design
JF  - Proceedings ICT2001. 20 International Conference on Thermoelectrics
PB  - IEEE
CY  - Piscataway, NJ, USA
ER  -