TY - Generic T1 - Study of the thermal behaviour of PN thermoelectric couples by laser probe interferometric measurement T2 - Proceedings ICT2001. 20 International Conference on Thermoelectrics Y1 - 2001 A1 - Patino-Lopez, L. D. A1 - Dilhaire, S. A1 - Grauby, S. A1 - Jorez, S. A1 - Claeys, W. A1 - Uemura, K. A1 - Stockholm, J. G. KW - light interferometry AB - The purpose of the present paper is to provide experimental data related to the temperature distribution within thermoelectric devices (TE). Moreover our aim is to get this knowledge for a dynamic temperature response of the device. We propose a non-contact optical measuring method, based upon very high-resolution interferometry, to map temperature effects upon the surface of running thermoelectric devices. The Peltier sources within the device generate thermal waves associated to heat transport. These waves interfere when AC current is driven through the device. The interferences are clearly observed in our measurements, showing how heat flows from different sources and merge. The measuring method can be used to check material properties which in turns allows to optimize contact design JF - Proceedings ICT2001. 20 International Conference on Thermoelectrics PB - IEEE CY - Piscataway, NJ, USA ER - TY - CONF T1 - Study of the thermal behaviour of PN thermoelectric couples by Laser Probe Interferometric Measurement T2 - Proceedings International conference on Thermoelectrics Y1 - 2001 A1 - L. D. PatiƱo_Lopez A1 - Dilhaire, S. A1 - Grauby, S. A1 - Jorez, S. A1 - Claeys, W. A1 - K-I. Uemura A1 - John G. Stockholm JF - Proceedings International conference on Thermoelectrics PB - IEEE Catalog number 01TH8589 CY - Beijing, China SN - 1094-2734 ER - TY - Generic T1 - Prototype thermoelectric air conditioning of a passenger railway coach T2 - 4th International Conference on Thermoelectric Energy Conversion Y1 - 1982 A1 - Stockholm, J. G. A1 - Pujol-Soulet, L. A1 - Sternat, P. ED - Rao, K. R. JF - 4th International Conference on Thermoelectric Energy Conversion PB - IEEE Catalog number 82CH1793-2 CY - Arlington, Texas ER -