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Jorez, S., S. Dilhaire, L. P. Lopez, S. Granby, W. Claeys, K. Uemura, and J. G. Stockholm, "Strain imaging in thermoelectric devices by laser probe shearography", Proceedings ICT2001. 20 International Conference on Thermoelectrics, Piscataway, NJ, USA, IEEE, pp. 503-6, 2001.

Jorez, S., S. Dilhaire, P. L. Lopez, S. Grauby, W. Claeys, K. - I. Uemura, and J. G. Stockholm, "Strain imaging in thermoelectric components by laser probe shearography", Proceedings International conference on Thermoelectrics, Beijing China, IEEE Catalog number 01TH8589,, pp. 503-506, 8-10 June 2001.

Jorez-ICT-2001.pdf (403.45 KB)