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Proceedings Article

Goudot, A., P. M. Schlicklin, and J. G. Stockholm, "Thermoelectric material characterization at 300 K", 5th International Conference on Thermoelectric Energy Conversion, Arlington, Texas, pp. 49-55, 14-16 March 1984.

Goudot-ICT1984-1984.pdf (895.21 KB)

Patino-Lopez, L. D., S. Dilhaire, S. Grauby, S. Jorez, W. Claeys, K. Uemura, and J. G. Stockholm, "Study of the thermal behaviour of PN thermoelectric couples by laser probe interferometric measurement", Proceedings ICT2001. 20 International Conference on Thermoelectrics, Piscataway, NJ, USA, IEEE, pp. 499-502, 2001.

Jorez, S., S. Dilhaire, L. P. Lopez, S. Granby, W. Claeys, K. Uemura, and J. G. Stockholm, "Strain imaging in thermoelectric devices by laser probe shearography", Proceedings ICT2001. 20 International Conference on Thermoelectrics, Piscataway, NJ, USA, IEEE, pp. 503-6, 2001.

Stockholm, J. G., P. M. Schlicklin, and A. Goudot, "Experimental characterization with single-band analysis of Bismuth-Telluride materials at 300 K", 20th Intersociety Energy Conversion Engineering Conference, Miami, Florida, Society of Automotive Engineers, Warrendale, PA., pp. Paper 859464 Session EC3, 1985.

Stockholm-20thIECEC-1985.pdf (775.29 KB)

Conference Paper

Semenyuk, V., J. Stockholm, and F. Gerard, "Thermoelectric Cooling of High Power Extremely Localized Heat Sources: System Aspects", International thermoelectric conference ICT’99, Baltimore, Maryland USA, IEEE Catalog number 99TH8407, pp. 40-44, August 30 Sept. , 1999.

Semenyuk-ICT-1999.pdf (519.99 KB)

Patiño_Lopez, L. D., S. Dilhaire, S. Grauby, S. Jorez, W. Claeys, K. - I. Uemura, and J. G. Stockholm, "Study of the thermal behaviour of PN thermoelectric couples by Laser Probe Interferometric Measurement", Proceedings International conference on Thermoelectrics, Beijing, China, IEEE Catalog number 01TH8589, pp. 499-502, 8-10 June 2001.

Lopez-ICT-2001.pdf (561.4 KB)

Jorez, S., S. Dilhaire, P. L. Lopez, S. Grauby, W. Claeys, K. - I. Uemura, and J. G. Stockholm, "Strain imaging in thermoelectric components by laser probe shearography", Proceedings International conference on Thermoelectrics, Beijing China, IEEE Catalog number 01TH8589,, pp. 503-506, 8-10 June 2001.

Jorez-ICT-2001.pdf (403.45 KB)